Challenges School
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| ROOM 10 |
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September 21-22-23 |
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The School will be held both REMOTELY and IN ATTENDANCE |
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| Chairs: Daniele PASSERI, Sapienza University of Rome & Stefania MELANDRI, Warrant Hub | |||||||||||
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The course is dedicated to PhD students and postdoc young scientists, from Italian and European Institutions, companies and industry. The programme includes 2 days of frontal lessons and 1 day of training (i.e. lessons, visits and practical demonstrations) at the Laboratory for Nanotechnologies and Nanosciences of Sapienza (SNN-Lab) of the interdepartmental research center on nanotechnologies applied to engineering (CNIS) and at the ATOM (Open Infrastructure for Advanced Tomography and Microscopies) Research Center. The topics covered by the CHALLENGES School will be focused on:
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| Wednesday 21 September | |||||||||||
| 09:00 - 09:30 | Arrival & Registration | ||||||||||
| 09:30 - 09:45 | Welcome and introduction Daniele PASSERI Sapienza University of Rome |
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| Strain in materials science and conventional characterization methods | |||||||||||
| 09:45 - 10:30 | Stefania MELANDRI Warrant Hub S.p.A. - Tinexta Group CHALLENGES Introduction |
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| General introduction on strain in materials science Paolo POSTORINO Sapienza University of Rome |
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| 10:30 - 11:15 | Introduction to strain characterization methods in Transmission Electron Microscopy Roberto BALBONI CNR-IMM, Bologna |
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| 11:30 - 12:15 | Metrological raman spectroscopy for strain characterization Stefan WUNDRACK Physikalisch-Technische Bundesanastalt (PTB), Germany |
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| 12:15 - 13:00 | X-ray strain analysis Patrice GERGAUD CEA-Leti, France |
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| light lunch | |||||||||||
| Innovative plasmonic techniques for strain characterization | |||||||||||
| 14:00 - 14:45 | Basics on plasmonic enhanced characterization techniques Aaron LEWIS NANONICS, Israel |
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| 14:45 - 15:30 |
Enhanced Optical Heating of Silicon Nano-Cones Under CW Illumination |
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| 15:45 - 16:30 | Plasmonic enhanced optical spectroscopy - from the lab environment to the factory floors Aaron LEWIS NANONICS, Israel |
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| 16:30 - 17:15 | AI and machine learning algorithms to fast optical material metrology tools Roy PINHASSI - CV NOVA, Israel |
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| Thursday 22 September |
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| 09:00 - 09:30 | Arrival | ||||||||||
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Introduction Daniele PASSERI Sapienza University of Rome |
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| Nanomaterials production in industrial environment | |||||||||||
| 09:45 - 10:30 | Metrology for process control in semiconductor industry Delphine LE CUNFF - CV STMicroelectronics, France |
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| 10:30 - 11:15 | Status and production process of crystalline Silicon solar cells and modules Ivan GORDON - CV IMEC, Belgium |
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| 11:30 - 12:15 |
Process control and QC on graphene |
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| Transmission Electron Microscopy for 2D materials characterization & standardization Vittorio MORANDI CNR-IMM, Bologna |
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| Simulation and modelling | |||||||||||
| 12:15 - 13:00 | Multiscale simulation and modelling Matthias AUF DER MAUR - CV Tiberlab |
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| light lunch | |||||||||||
| 14:30 - 17:00 | Visit to Laboratories of CNIS (Interdepartmental Research Center on Nanotechnologies applied to Engineering of Sapienza): Laboratory for Nanotechnologies and Nanosciences of Sapienza (SNN-LAB) Open Infrastructure for Advanced Tomography and Microscopies Research Center (ATOM) |
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| Friday 23 September | |||||||||||
| 09:00 - 09:30 | Arrival and Introduction Daniele PASSERI Sapienza University of Rome |
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| 09:30 - 09:50 | CHALLENGES - Real Time Nano Characterization Related Technologies Project Daniele PASSERI Sapienza University of Rome |
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| 09:50 - 10:10 | Horizon Europe: new challenges and opportunities (WH) | ||||||||||
| 10:10 - 10:30 | European Materials Modelling Council (EMMC) and European Materials Characterisation Council (EMCC) Marco SEBASTIANI, Roma Tre University Gerhard GOLDBECK, EMMC ASBL |
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| 10:30 - 11:30 |
PITCH SESSION - SISTERS PROJECTS
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| break | |||||||||||
| 11:45 - 13:00 | Round Table, Discussion and Conclusion |  |
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| Download QR code | ||
